System
Wafer inspection system Cosmo Finder

Low-cost, space-saving design! Realize fast appearance image inspection!

The Wafer Visual Appearance Inspection apparatus using the microscope achieves high speed and precise inspection with image processing. This apparatus solves problems such as "Not being able to inspect all of the wafers" and "Cannot detect small objects of only a few μm in size or scratches". High performance while saving space, and it can be used in every scenario.
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