Electronic Microscope JEOL

JCM-7000 desktop scanning electron microscope is designed with the idea that anyone can use a SEM/EDS. equipped with features such as "Zeromag" which enlarges the optical image to allow viewing of SEM images, "Live 3D" which allows 3 dimensional observation while performing SEM observations, and "Live Analysis" which allows you to observe the elements in the field of view you are watching without turning on the analyzer.

■Main specifications of JCM-7000
magnification：×10～×100,000
observation mode
high vacuum：secondary electron image、backscattered electron image（composition, unevenness, 3D model）/ 3D image
low vacuum：backscattered electron image（composition, unevenness, 3D model）/ 3D image
acceleration voltage：5kV / 10kV / 15kV 3 stage switching
electron gun：tungsten filament and wehnelt integrated grid compact electron gun
motor driven stage：X-Y 2-axis　standard
auto functions：full auto, auto focus, auto stigma, auto contrast brightness, auto gun alignment
operation：selectable from touch panel or mouse
maximun sample size：80 mm diameter × 50 mm height
options：energy dispersive X-ray spectrometer, tilt/rotation motordriven holder, 2-axis motordriven stage