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Contamination Visualization System “CVS-I” – Particle Lab
Safe and compact — visualize submicron airborne particles easily, no laser required!
The world’s first visualization system that enables direct observation of submicron particles with the naked eye without using hazardous laser light or complex camera systems. Simple operation makes it possible to detect fine particles that once required experts or special instruments, greatly improving work efficiency on production sites.
■ Lineup
■ Key Features ■ Main Specifications 
▲ Coarse Particle Visualization System — CVS-LED
・Enables visual observation of submicron particles without dangerous lasers, using only a light source.
・No complex camera setup required — easy visualization with a standalone light source for routine on-site particle monitoring.
・Compact light source and camera allow direct inspection even in confined spaces inside equipment.
・Equipped with advanced image processing technology that clearly captures even extremely small particles invisible to the naked eye.
※ Visibility of submicron particles may vary depending on environmental conditions.
・Capable of visualizing not only airborne contaminants but also particles adhering to object surfaces.
・Visualization Light Source
Emission Principle: LD-excited fluorescence emission method
Wavelength/Color: Broad-spectrum, low-coherence green light with 550 nm peak
Laser Class: Class 1 (JIS C 6802:2014 Appendix C compliant)
Dimensions / Weight: 150 × 260 × 350 mm / 8.8 kg
・Real-Time Image Processing Camera
Effective Pixels: 5 megapixels
Image Sensor: 2/3" Monochrome CMOS
Interface: USB 3.0 (bus-powered)
Frame Rate: Up to 75 fps (full frame), 280 fps (VGA)
Dimensions / Weight: 35 × 29 × 16 mm (excluding protrusions) / 50 g
Image Processing Software
・Image Processing Software
Software Functions: Submicron particle filter, Low-noise particle extraction filter, Adhesion contamination visualization filter, Motion tracking, Background removal, Focus range display function
