PRODUCTS

JSX-1000S is a fluorescent X-ray spectrometer that uses a touch panel for easy elemental analysis. Equipped with general qualitative and analysis (FP method, cabibration curve method) and RoHS element screening function. various options for both hardware and software enable a wider range of analyses.

We have released various types of FT-IR that boast high resolution and high sensitivity, as well as various accessory devices such as an infrared microscope unit that pursues automation. These are used for qualitative analysis of defect locations on minute parts (IC chips, etc.) in the electronics, electrical, and semiconductor fields, as well as for various structural analysis and nondestructive measurement. It has earned a high reputation.

JCM-7000 desktop scanning electron microscope is designed with the idea that anyone can use a SEM/EDS. equipped with features such as "Zeromag" which enlarges the optical image to allow viewing of SEM images, "Live 3D" which allows 3 dimensional observation while performing SEM observations, and "Live Analysis" which allows you to observe the elements in the field of view you are watching without turning on the analyzer.

The world’s first visualization system that enables direct observation of submicron particles with the naked eye without using hazardous laser light or complex camera systems. Simple operation makes it possible to detect fine particles that once required experts or special instruments, greatly improving work efficiency on production sites.